
70 GHz VNA system
Anritsu lancerer 12-Port 70 GHz VNA system, som kan udføre signalintegritets målinger med høj præcision (in english).
Anritsu Company introduces a scalable 12-port, 70 GHz measurement system based on its award-winning VectorStar broadband vector network analyzer (VNA) that can conduct highly accurate signal integrity measurements.
Combining the VNA with advanced microwave technologies and dedicated software in a single system, the 12-port 70 GHz system can provide accurate and precise multi-port balanced differential and mixed-mode measurements required for today’s high-speed bus designs.
The VectorStar 12-port system is specified over the 40 MHz to 67 GHz range, but is operational up to 70 GHz. It is designed with mobile port modules that are connected to the interface test set with flexible V cables, allowing for the placement of the ports as close to the device under test (DUT) as possible. The result is improved measurement stability compared to alternative systems.
To further improve performance, low-loss solid state 70 GHz switches have been deve
Innovative Software
Anritsu collaborated with High Frequency Engineering Sagl (HFE) to develop innovative software for use with the 12-port 70 GHz VNA system. The MMSNT software is used for the calibration of the system, and subsequently for measurements. HFE offers industry-proven algorithms for the calibrations, with fewer connections and high measurement accuracy.
The software also has powerful graphic capabilities, as well as 12-port differential parameters, TDR, eye diagram, and custom macro capabilities. A direct link to Excel allows for fast data processing and exporting of data as a Touchstone file.
Designed for High-speed Bus Applications
The VectorStar 12-port 70 GHz VNA system has been developed to address measurement requirements dictated by today’s high-speed bus designs. It can be used by manufacturers of high-frequency and high-speed computer and communications interconnect solutions to verify performance, to conduct signal integrity tests on Serializer/De-serializer ICs at the on-wafer stage, and in a variety of wireless communications and aerospace/defense applications.
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