Prober til PCIe test

Agilent introducerer nye probeløsninger til firmaet PCI Express prober til 2960B serien af analysatorer (in english).

This simplifies troubleshooting situations where it is unclear whether the fault lies in the physical layer or in protocol interactions. The new ZIF flying leads probe supports both 2.5 GT/s and 5.0 GT/s PCI Express data rates.  
 
One of the challenges associated with debugging any PCIe 2.0 problem is determining if the root cause is due to the logic design or caused by signal-integrity issues at the physical layer.

 Determining root cause is especially difficult in embedded designs such as medical instruments as well as communication and military designs. With Agilent’s new ZIF flying leads probe, the same ZIF tip soldering point can be used with the oscilloscope for physical layer measurements or with the protocol to debug protocol problems.

- Agilent is the industry leader in PCI Express measurement, with tools that cover physical layer and protocol layer testing, says Jun Chie, marketing manager for Agilent’s Logic and Protocol Test business.
- With this unique coverage, we can provide our customers with leverage between these tools. This is a key time savings and cost savings for our customers, and very important especially in this economic climate.
 
At PCIe 2.0 speeds, reliable probing becomes even more important. Without a reliable probing solution and the right form factor, reliable data capture becomes difficult if not impossible. Agilent’s ZIF flying leads probe is designed for reliable signals and ease of probing access.