Rohde & Schwarz afholder online konference om powerelektronik
Den 5. og 6. maj er Rohde & Schwarz vært for en online-konference, der fokuserer på pålidelige måle- og valideringsmetoder for powerelektronik-systemer. Det er gratis at deltage (in english).
The power electronics market is being driven by stricter efficiency targets, higher power densities and increasing integration with large-scale power grids. Consequently, engineers must cope with non-ideal component behavior, fast transient stresses on wide-bandgap devices and ever more demanding EMC requirements.
Rohde & Schwarz will focus on these topics in a power electronics online conference called 'From Design to Validation' on May 5 and 6, 2026.
The conference will address the challenges by presenting measurement-centric solutions that can be implemented with modern oscilloscopes, vector network analyzers and precision power analyzers.
In a keynote on the opening day May 5 Tobias Keller from Hitachi Energy will discuss the qualification of silicon and silicon carbide (SiC) devices for high-voltage grid applications, focusing on thermal cycling, short-circuit robustness and long-term reliability data.
Infineon Technologies will in a keynote May 6 delivered by Veit Hellwig examine the impact of gallium-nitride (GaN) technology on high-voltage motor inverter topologies.
In addition to the keynotes, the conference comprises a series of technical sessions. One presentation will analyze passive component characterization, highligthing metods for extracting parasitic inductance and capacitance at frequencies above 100 MHz and demonstrating the influence of these non-idealities on converter stability.
Another session will detail automated dynamic characterization of SiC and GaN power devices, showing how double-pulse test rigs can be syncronized with high-speed digitizers to reducere measurement uncertainty and to capture fast recovery behavior.
Electromagnetic compatibility topics are covered in two dedicated talks. The first provides practical guidance on the use of near-field probes for pinpointing radiated emission sources and for validating the effectiveness of EMI filter designs.
The second demonstrates a complete conducted emission measurement workflow on a small-scale prototype, using a Line Impedance Stabilization Network (LISN) together with a modern mixed signal oscilloscope. The presenter will also outline a filter design methodology that exploits the time frequency capabilities of the instrument.
A further webinar addresses the growing need for accurate efficiency measurement in data center and AI server power supplies. By employing precision power analyzers capable of tracking distorted waveforms and rapid load transients, participants will learn how to obtain true input and output power values that satisfy 80 Plus certification requirements.
The last session focuses on harmonic current and flicker compliance for low-voltage, grid-connected products. The speaker will review the limits and test procedures defined in IEC/EN 61000-3-2/-3-3 and IEC/EN 61000-3-12/-3-11. It will be demonstrated how integrated compliance test software linked to a power analyzer can deliever automated pass/fail decisions form early prototype evaluation through to final type approval.
Speakers incluce subject matter experts from Rohde & Schwarz, Hitachi, Infineon, PE-Systems, Würth Elektronik and the Universities in Bremen and Zaragoza. Their contributions combine academic insight and industrial experience, providing attendees with both theoretical background and measurement strategies.
The conference is free of charge, but registration is required. The full agenda, speaker biographies and the registration portal are available at:
