Ny testløsning til karakterisering af PCI Express 3.0

Agilent Technologies lanceret udvidet og forbedret løsning til karakterisering af PCI Express receivere (in english).

Agilent Technologies has announced an enhanced solution for PCI Express 3.0 receiver characterization. The Agilent PCIe3.0 receiver characterization solution provides complete and accurate receiver tolerance test results while minimizing R&D effort.



The new J-BERT software (revision 7.40) enables testing of PCIe 3.0 receiver designs that adjust the length of the 128b/130b encoded filler symbols - also known as SKP ordered sets - as needed for clock compensation.



Using the Agilent test set, design and test engineers in the semiconductor and computer industry can accurately characterize and verify standard compliance of PCIe receiver ports in ASICs, add-in cards and motherboards.



Since the release of revision 3.0 of the PCI Express specification, the 8-GT/s interface has been designed into many computer platforms. A common reference clock often is used for PCIe designs, but more and more designs now require a separate reference clock architecture with independent spread spectrum clocking (SSC) such as a PCIe-over-cable link.



When designers use separate reference clocks, they need to compensate for small differences in the clock rate on the transmitter and receiver sides to avoid buffer overflow. Clock compensation can be required even for common reference clock designs on motherboards, in the presence of SSC or when using multiplying phase-locked loops.



The PCI Express standard requires this compensation to be accomplished by adding SKP symbols to (or removing them from) the nominal SKP ordered set.

Agilent’s new J-BERT N4903B high-performance serial bit-error ratio tester software enables receiver testing in cases where the SKP ordered set length is changed by the device under test in loopback mode.



The J-BERT error detector can now ignore SKP ordered sets when counting errors, even when they deviate from the original length sent out by the pattern generator. When engineers debug their designs, they can monitor SKP ordered set counters in the error detector.



- For PCIe 3.0 chipset and board designers, our solution’s ability to handle adjustments of PCIe 3.0 SKP ordered sets during receiver jitter tolerance characterization fills a critical need. The flexible architecture of our J-BERT, along with our long expertise in PCI Express receiver testing, allowed us, once again, to address emerging test challenges, says Michael Fleischer-Reumann, strategic product planner for Agilent’s Digital Photonic Test Division.



With this enhancement, Agilent continues to broaden its complete and accurate PCIe 3.0 receiver test solution, which can be used for characterizing against the base specification as well as the card-electro-mechanical specification.



The Agilent receiver test solution encompasses the J-BERT N4903B high-performance serial BERT, the N4916B de-emphasis signal converter, the N4915A-014 PCIe 3.0-compliant calibration channels, the 81150A or 81160A pulse function arbitrary noise generator, an Infiniium 90000 or 90000 X-Series high-performance oscilloscope, and N5990A-101 and N5990A-301 test automation and link training software. For motherboard testing, the N4880A reference clock multiplier is available.

Altoo Measurement Science ApS
kunde.service@altoo.dk
Phone: 70 13 15 15
www.altoo.dk

29/1 2013
  • Tablet til brug i de mest krævende målemiljøer

    Tablet til brug i de mest krævende målemiljøer

    t-og-m ›Med sigte på systemintegratorer og leverandører af skræddersyede løsninger, tilbyder det tyske firma Aaronia nu en ny ekstrem robust tablet-platform (in english).
  • Ny adm. direktør i Rohde & Schwarz Danmark

    Ny adm. direktør i Rohde & Schwarz Danmark

    t-og-m ›David Adgill Larsen er udnævnt til ny adm. direktør i Rohde & Schwarz Danmark A/S. Her afløser han Niels Frandsen, der har ledet firmaet i mere end 36 år.
  • EKTOS TRS holder 'åbnet hus' i testlaboratoriet i Struer

    EKTOS TRS holder 'åbnet hus' i testlaboratoriet i Struer

    t-og-m ›Med fokus på præ-compliance EMC test afholder EKTOS på firmaets TRS-laboratorium i Struer den 3. september en ny TRS Open Lab session.
  • Ny generation af split core strømsensorer

    Ny generation af split core strømsensorer

    sensorer ›Til brug i pladsbegrænsede applikationer - som f.eks. i forbindelse med in-vehicle xEV testopgaver - lancerer Yokogawa ny generation af split core strømsensorer (in english).
  • FR3 testbed til 6G-forskning

    FR3 testbed til 6G-forskning

    t-og-m ›Korea Testing & Research Institute opbygger 6G-testbed omkring Anritsu' MT8000A, der understøtter FR3 frekvensområdet, som forventes brugt i fremtidige 6G-systemer (in english).
  • Rohde & Schwarz samler aktiviteter

    Rohde & Schwarz samler aktiviteter

    t-og-m ›LANCOM Systems og Rohde & Schwarz Cybersecurity fusionerer og vil i fremtiden operere som Rohde & Schwarz Networks and Cybersecurity (in english).
  • XJTAG understøtter nu FTDI

    XJTAG understøtter nu FTDI

    aktive-komponenter-og-embedded-sw ›XJTAG, en førende leverandør af test- og programmeringsløsninger, understøtter nu FTDI's JTAG-controllerhardware i version 4.3 af XJTAG-softwaresuiten (in english).
  • Anritsu strømliner udvikling og evaluering af 5 RedCap løsninger

    Anritsu strømliner udvikling og evaluering af 5 RedCap løsninger

    t-og-m ›Anritsu annoncerer, at firmaets udvidede SmartStudio NR (SSNR) og SmartStudio NR IP Performance (SSIP) softwareløsninger nu inkluderer support af 5G RedCap devicetest (in english).